Deep sub-micron chip development
โ Scribed by Hirokazu Ikeda
- Book ID
- 103856053
- Publisher
- Elsevier Science
- Year
- 2006
- Tongue
- English
- Weight
- 171 KB
- Volume
- 569
- Category
- Article
- ISSN
- 0168-9002
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๐ SIMILAR VOLUMES
Suppressing the leakage current in memories is critical in low-power design. By reducing the standby supply voltage (V DD ) to its limit, which is the data retention voltage (DRV), leakage power can be substantially reduced. This paper models the DRV of a standard low leakage SRAM module as a functi
In order to confirm benefits of a deep sub-micron FD-SOI and to identify possible issues concerning front-end circuits with the FD-SOI, we have submitted a small design to Oki Electric Industry Co., Ltd. via the multi-chip project service of VDEC, the University of Tokyo. The initial test results an