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Electron and hole impact ionization in deep sub-micron MOSFETs

✍ Scribed by Marco Mastrapasqua; Jeff D. Bude

Publisher: Elsevier Science
Year: 1995
Tongue: English
Weight: 583 KB
Volume: 28
Category: Article
ISSN: 0167-9317
DOI: 10.1016/0167-9317(95)00062-d

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