Deep level transient spectroscopy of interface and bulk trap states in InP metal/oxide/semiconductor structures

✍ Scribed by Masahide Inuishi; Bruce W. Wessels

• Publisher: Elsevier Science
• Year: 1983
• Tongue: English
• Weight: 502 KB
• Volume: 103
• Category: Article
• ISSN: 0040-6090
• DOI: 10.1016/0040-6090(83)90431-5