Deep-level transient spectroscopy measurements of majority carrier traps in neutron irradiated n-type silicon detectors

✍ Scribed by E. Borchi; C. Bertrand; C. Leroy; M. Bruzzi; C. Furetta; R. Paludetto; P.G. Rancoita; L. Vismara; P. Giubellino

• Publisher: Elsevier Science
• Year: 1989
• Tongue: English
• Weight: 287 KB
• Volume: 279
• Category: Article
• ISSN: 0168-9002
• DOI: 10.1016/0168-9002(89)91093-0