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Deep-level characterization of AlxIn1−xAs layers grown by low pressure metal-organic chemical vapor deposition

✍ Scribed by E. Bearzi; F. Ducroquet; G. Guillot; J. Tardy; C. Caneau; W. Chan; R. Bhat

Publisher: Elsevier Science
Year: 1994
Tongue: English
Weight: 277 KB
Volume: 28
Category: Article
ISSN: 0921-5107
DOI: 10.1016/0921-5107(94)90097-3

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