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Deconvolution of Kelvin probe force microscopy measurements—methodology and application

✍ Scribed by Machleidt, T; Sparrer, E; Kapusi, D; Franke, K-H

Book ID: 120381126
Publisher: Institute of Physics
Year: 2009
Tongue: English
Weight: 678 KB
Volume: 20
Category: Article
ISSN: 0957-0233
DOI: 10.1088/0957-0233/20/8/084017

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