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DC Characteristics of MOS Structures and Hopping Currents in Thermally Grown SiO2 Films

✍ Scribed by Krause, H.

Publisher: John Wiley and Sons
Year: 1982
Tongue: English
Weight: 662 KB
Volume: 72
Category: Article
ISSN: 0031-8965
DOI: 10.1002/pssa.2210720222

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