Damage mechanisms in impact-ionization-induced mixed-mode reliability degradation of SiGe HBTs

✍ Scribed by Chendong Zhu; Qingqing Liang; R. Al-huq; J. Cressler; Yuan Lu; Tianbing Chen; A. Joseph; Guofu Niu

• Book ID: 126685915
• Publisher: IEEE
• Year: 2005
• Tongue: English
• Weight: 743 KB
• Volume: 5
• Category: Article
• ISSN: 1530-4388
• DOI: 10.1109/TDMR.2005.843835