✦ LIBER ✦
A new "mixed-mode" reliability degradation mechanism in advanced Si and SiGe bipolar transistors
✍ Scribed by Gang Zhang; Cressler, J.D.; Guofu Niu; Joseph, A.J.
- Book ID
- 114616912
- Publisher
- IEEE
- Year
- 2002
- Tongue
- English
- Weight
- 503 KB
- Volume
- 49
- Category
- Article
- ISSN
- 0018-9383
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