𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Damage depth profiles for high energy ion implanted silicon

✍ Scribed by Tohru Hara; Takeshi Muraki; Masataka Sakurai; Satoru Takeda; Inoue Morio; Fuji Shinji


Book ID
113283678
Publisher
Elsevier Science
Year
1993
Tongue
English
Weight
558 KB
Volume
74
Category
Article
ISSN
0168-583X

No coin nor oath required. For personal study only.


πŸ“œ SIMILAR VOLUMES


Damage Profiles in Ion Implanted Silicon
✍ Tkachev, V. D. ;HΓΆlzer, G. ;Chelyadinskii, A. R. πŸ“‚ Article πŸ“… 1984 πŸ› John Wiley and Sons 🌐 English βš– 185 KB
Damage profile on high energy ion implan
✍ Ascheron, C. ;Otto, G. ;Flagmeyer, R. ;Zschau, H.-E. ;Bugrov, V. N. ;Karamyan, S πŸ“‚ Article πŸ“… 1986 πŸ› John Wiley and Sons 🌐 English βš– 207 KB
High energy Li implanted profiles in sil
✍ M. Behar; M. Weiser; S. Kalbitzer; D. Fink; P.L. Grande πŸ“‚ Article πŸ“… 1989 πŸ› Elsevier Science 🌐 English βš– 355 KB