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Damage accumulation in Si during N+ and N2+ bombardment along random and channeling directions

โœ Scribed by Andrei I. Titov; Sergei O. Kucheyev


Book ID
114170607
Publisher
Elsevier Science
Year
1999
Tongue
English
Weight
182 KB
Volume
149
Category
Article
ISSN
0168-583X

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