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Current reliability results on electron-bombarded-semiconductor power devices

✍ Scribed by Bates, D.J.; Knight, R.I.; Taylor, G.; Silzars, A.

Book ID: 114591731
Publisher: IEEE
Year: 1974
Tongue: English
Weight: 243 KB
Volume: 21
Category: Article
ISSN: 0018-9383
DOI: 10.1109/t-ed.1974.18004

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