✦ LIBER ✦

Electron-beam test on power semiconductor devices

✍ Scribed by M. Steck; K. D. Herrmann; E. Kubalek

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Reliability results on electron bombarde

✍ Bates, D.J.; True, R. 📂 Article 📅 1977 🏛 IEEE 🌐 English ⚖ 464 KB

Power Flow in Electron Beam Devices

✍ Louisell, W.H.; Pierce, J.R. 📂 Article 📅 1955 🏛 Institute of Electrical and Electronics Engineers 🌐 English ⚖ 674 KB

Current reliability results on electron-

✍ Bates, D.J.; Knight, R.I.; Taylor, G.; Silzars, A. 📂 Article 📅 1974 🏛 IEEE 🌐 English ⚖ 243 KB

Beam quality test technology and devices

✍ Y. Peng; K.H. Wang; Q. Zhou; Y.J. Wang; P.F. Fu 📂 Article 📅 2011 🏛 Elsevier Science 🌐 English ⚖ 660 KB

Electron-beam test system for high-speed

✍ M. Brunner; D. Winkler; R. Schmitt; B. Lischke 📂 Article 📅 1987 🏛 Hindawi Limited 🌐 English ⚖ 275 KB

4575630 Electron-beam testing of semicon

✍ George Lukianoff 📂 Article 📅 1987 🏛 Elsevier Science 🌐 English ⚖ 79 KB