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Reliability improvements in electron bombarded semiconductor power devices : D. J. Bates. IEEE 11th Annual Proceeding Reliability Physics (1973). p. 208

Publisher: Elsevier Science
Year: 1973
Tongue: English
Weight: 108 KB
Volume: 12
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(73)90160-1

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