Improved reliability of electron devices through optimized of coverage of surface topography : W. Kern J. L. Vossen and G. L. Schnable. IEEE 11th Annual Proceedings Reliability Physics (1973). p. 2

• Publisher: Elsevier Science
• Year: 1973
• Tongue: English
• Weight: 104 KB
• Volume: 12
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(73)90216-3