๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Current gain degradation induced by emitter-base avalanche breakdown in silicon planar transistors

โœ Scribed by A.J. Melia


Publisher
Elsevier Science
Year
1976
Tongue
English
Weight
403 KB
Volume
15
Category
Article
ISSN
0026-2714

No coin nor oath required. For personal study only.


๐Ÿ“œ SIMILAR VOLUMES