Current gain degradation induced by emitter-base avalanche breakdown in silicon planar transistors : A. J. Melia. Microelectron. Reliab.15, 619 (1976)

• Publisher: Elsevier Science
• Year: 1977
• Tongue: English
• Weight: 126 KB
• Volume: 16
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(77)90763-6