✦ LIBER ✦
Gain degradation in planar transistors following emitter-base reverse biassing : R. F. Haythornthwaite, IEE Conf. Reliab. Electron., Conf. Publ. No. 60, 10–12 December (1969), p. 123
- Publisher
- Elsevier Science
- Year
- 1970
- Tongue
- English
- Weight
- 211 KB
- Volume
- 9
- Category
- Article
- ISSN
- 0026-2714
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