๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Crystallographic incident beam effects in quantitative Auger electron spectroscopy

โœ Scribed by A.F. Armitage; D.P. Woodruff; P.D. Johnson

Book ID
118983386
Publisher
Elsevier Science
Year
1980
Tongue
English
Weight
444 KB
Volume
100
Category
Article
ISSN
0039-6028

No coin nor oath required. For personal study only.

๐Ÿ“œ SIMILAR VOLUMES

Inelastic scattering effects in quantita
Inelastic scattering effects in quantitative Auger electron spectroscopy
๐Ÿ“‚ Article ๐Ÿ“… 1976 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 137 KB

correlation between current and the work-functions of the metals was found. The current can be explained in terms of electron transfer induced by the contact of substances having different work-functions. (Canda)

Electron-beam effects in depth profiling
Electron-beam effects in depth profiling measurements with Auger electron spectroscopy
๐Ÿ“‚ Article ๐Ÿ“… 1976 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 137 KB

The advantages of ion etching over wet chemical etching are demonstrated, e,g. structure resolution in the region of the etching depth, no undercutting, excellent reproducibility and high adherence of small striplines.