Crystallization of SiO2–TiO2 glassy films studied by atomic force microscopy
✍ Scribed by A Karthikeyan; Rui M Almeida
- Book ID
- 117144584
- Publisher
- Elsevier Science
- Year
- 2000
- Tongue
- English
- Weight
- 327 KB
- Volume
- 274
- Category
- Article
- ISSN
- 0022-3093
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## Ž . Ž . We have demonstrated the characterizations of the local electrical properties of ultrathin 1-4 nm SiO rSi 001 2 Ž y5 . structures using a conducting atomic force microscopy with a nanometer-scale resolution in a vacuum 1 = 10 Pa . The measurement in a vacuum enables to reduce the influe