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Crystal structure of synthesized CuGa0.5In0.5Te2determined by X-ray powder diffraction using the Rietveld method

✍ Scribed by M. León; J. M. Merino; J. L. Martín De Vidales

Publisher: Springer
Year: 1993
Tongue: English
Weight: 391 KB
Volume: 28
Category: Article
ISSN: 0022-2461
DOI: 10.1007/bf01151681

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## Abstract Least‐square refinement of x‐ray powder diffraction patterns analyzed by the Rietveld method can yield structural information which had been unattainable or at least elaborate to obtain by conventional pattern analysis. The Rietveld method calculates a powder pattern on the basis of a s