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Crystal Structure Refinement of CuxAg1-xInTe2 Bulk Material Determined from X-Ray Powder Diffraction Data Using the Rietveld Method.

✍ Scribed by A. M. Moustafa; E. A. El-Sayad; G. B. Sakr


Publisher
John Wiley and Sons
Year
2004
Weight
59 KB
Volume
35
Category
Article
ISSN
0931-7597

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