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Crystal structure refinement of CuxAg1-xInTe2 bulk material determined from X-ray powder diffraction data using the Rietveld method

✍ Scribed by A. M. Moustafa; E. A. El-Sayad; G. B. Sakr


Publisher
John Wiley and Sons
Year
2004
Tongue
English
Weight
200 KB
Volume
39
Category
Article
ISSN
0232-1300

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