Capacitance–Voltage Characterization of
Capacitance–Voltage Characterization of AlN MIS Structures Grown on 6H-SiC(0001) Substrates by MOCVD
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W. Hageman; A. Rys; J. Schmitt; J.H. Edgar; B. Liu; D.D. Koleske
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Article
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2003
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John Wiley and Sons
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English
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