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Critical thickness and strain relaxation in lattice mismatched II–VI semiconductor layers

✍ Scribed by Pinardi, K.; Jain, Uma; Jain, S. C.; Maes, H. E.; Van Overstraeten, R.; Willander, M.


Book ID
120486025
Publisher
American Institute of Physics
Year
1998
Tongue
English
Weight
454 KB
Volume
83
Category
Article
ISSN
0021-8979

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