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Depth profiling of elastic strains in lattice-mismatched semiconductor heterostructures and strained-layer superlattices

✍ Scribed by Olego, D. J.; Shahzad, K.; Petruzzello, J.; Cammack, D.


Book ID
118240366
Publisher
The American Physical Society
Year
1987
Tongue
English
Weight
190 KB
Volume
36
Category
Article
ISSN
1098-0121

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