๐”– Bobbio Scriptorium
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Critical investigations of the secondary ion emission of pure metals using the pseudo-atom method

โœ Scribed by J. Antal; S. Kugler; B. Zsigmond


Book ID
113000302
Publisher
Springer-Verlag
Year
1980
Weight
30 KB
Volume
49
Category
Article
ISSN
0001-6705

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A series of ionic and neutral Group VIII transition metal complexes with molecular masses up to 2500 u were analysed by time-of-flight secondary ion mass spectrometry (SIMS) and plasma desorption mass spectrometry (PDMS). The secondary ion emission, the secondary ion yields and the yield ratios Y(PD