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Critical current density and flux pinning in Ho‐doped melt‐processed YBa2Cu3Oy

✍ Scribed by Feng, Yong; Zhou, Lian; Du, Shejun; Wu, Xiaozu; Tholence, J. L.; Vallier, J. C.; Monceau, P.; Yin, B.; Li, Jinwei; Zhao, Zhongxian; Zhang, Yuheng

Book ID: 121825211
Publisher: American Institute of Physics
Year: 1996
Tongue: English
Weight: 272 KB
Volume: 80
Category: Article
ISSN: 0021-8979
DOI: 10.1063/1.362912

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