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Critical behavior of the dielectric properties near the metal-non-metal transition in Cr/p+ a-Si:H/V thin film devices

✍ Scribed by J. Hu; A.J. Snell; J. Hajto; A.E. Owen; M.J. Rose

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Capacitance anomaly near the metal—non-m

✍ Hu, J.; Hajto, J.; Snell, A. J.; Owen, A. E.; Rose, M. J. 📂 Article 📅 1996 🏛 Taylor and Francis Group 🌐 English ⚖ 670 KB

Interfacial properties of metal-silicon

✍ T. Pisarkiewicz 📂 Article 📅 1980 🏛 Elsevier Science 🌐 English ⚖ 286 KB

Critical behavior of transport and magne

✍ D. A. Knyazev; O. E. Omel’yanovskii; V. M. Pudalov; I. S. Burmistrov 📂 Article 📅 2007 🏛 SP MAIK Nauka/Interperiodica 🌐 English ⚖ 212 KB