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Critical assessment of birefringence imaging of dislocations in 6H silicon carbide

✍ Scribed by Le Thi Mai Hoa; T. Ouisse; D. Chaussende


Book ID
116630356
Publisher
Elsevier Science
Year
2012
Tongue
English
Weight
975 KB
Volume
354
Category
Article
ISSN
0022-0248

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