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Coverage Driven High-Level Test Generation Using a Polynomial Model of Sequential Circuits

✍ Scribed by Alizadeh, B.; Mirzaei, M.; Fujita, M.

Book ID: 115443100
Publisher: IEEE
Year: 2010
Tongue: English
Weight: 653 KB
Volume: 29
Category: Article
ISSN: 0278-0070
DOI: 10.1109/tcad.2010.2043571

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