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Correlation of trap generation to charge-to-breakdown (Qbd ): a physical-damage model of dielectric breakdown

✍ Scribed by Apte, P.P.; Saraswat, K.C.


Book ID
114535872
Publisher
IEEE
Year
1994
Tongue
English
Weight
844 KB
Volume
41
Category
Article
ISSN
0018-9383

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