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Correlation of stress and texture evolution during self- and thermal annealing of electroplated Cu films

✍ Scribed by Lee, Haebum; Wong, S. Simon; Lopatin, Sergey D.


Book ID
121278592
Publisher
American Institute of Physics
Year
2003
Tongue
English
Weight
439 KB
Volume
93
Category
Article
ISSN
0021-8979

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