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Interdiffusion, stress, and microstructure evolution during annealing in Co/Cu/Co trilayers

✍ Scribed by Bruckner, W.; Baunack, S.; Thomas, J.; Hecker, M.; Schneider, C. M.


Book ID
111872817
Publisher
American Institute of Physics
Year
2002
Tongue
English
Weight
633 KB
Volume
91
Category
Article
ISSN
0021-8979

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