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Evolution of microstructure and magnetoresistance in Co/Cu multilayers during annealing

✍ Scribed by K Rätzke; M.J Hall; D.B Jardine; W.C Shih; R.E Somekh; A.L Greer


Book ID
114230261
Publisher
Elsevier Science
Year
1999
Tongue
English
Weight
267 KB
Volume
204
Category
Article
ISSN
0304-8853

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