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Correlation of photoelectric properties of a-Si:H image sensor with compositional distribution of Si3N4 blocking interface

✍ Scribed by S. Kaneko; F. Okumura; H. Uchida; M. Kanamori; M. Sakamoto; T. Itano; U. Kajiwara; T. Saito

No coin nor oath required. For personal study only.

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