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Correlation of Hot-Carrier and Radiation Effects in MOS Transistors

✍ Scribed by McBrayer, J. D.; Fleetwood, D. M.; Pastorek, R. A.; Jones, R. V.

Book ID: 114663165
Publisher: IEEE
Year: 1985
Tongue: English
Weight: 932 KB
Volume: 32
Category: Article
ISSN: 0018-9499
DOI: 10.1109/tns.1985.4334046

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