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Correlation between the electrooptical properties and the composition of α-Si1−xGex:H (x<0.1) thin films

✍ Scribed by L. Nedialkova; D. Dimova-Malinovska; V. Kudojarova


Publisher
Elsevier Science
Year
1992
Tongue
English
Weight
282 KB
Volume
27
Category
Article
ISSN
0927-0248

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