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Characterization of a-Si:H/a-Si1−xNx:H superlattice films by photoluminescence measurements: The correlation between the preparation condition and the film quality

✍ Scribed by M. Yamaguchi; H. Ohta; C. Ogihara; K. Morigaki

Publisher: Elsevier Science
Year: 1990
Tongue: English
Weight: 993 KB
Volume: 5
Category: Article
ISSN: 0921-5107
DOI: 10.1016/0921-5107(90)90103-i

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