Correlation between Oxygen Composition and Electrical Properties in NiO Thin Films for Resistive Random Access Memory

✍ Scribed by Nishi, Yusuke; Iwata, Tatsuya; Kimoto, Tsunenobu

• Book ID: 125829173
• Publisher: Institute of Pure and Applied Physics
• Year: 2011
• Tongue: English
• Weight: 698 KB
• Volume: 50
• Category: Article
• ISSN: 0021-4922
• DOI: 10.1143/JJAP.50.015802