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Correlation between electrical properties and point defects in NiO thin films

โœ Scribed by Kwon, Yong Hun; Chun, Sung Hyun; Han, Jae-Hee; Cho, Hyung Koun


Book ID
118242363
Publisher
TechnoPress
Year
2012
Tongue
English
Weight
712 KB
Volume
18
Category
Article
ISSN
1598-9623

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