Correction to "Electron and hole drift velocity measurements in silicon and their empirical relation to electric field and temperatures"

✍ Scribed by Ottaviani, G.

• Book ID: 114592193
• Publisher: IEEE
• Year: 1976
• Tongue: English
• Weight: 41 KB
• Volume: 23
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/t-ed.1976.18555