𝔖 Bobbio Scriptorium

✦ LIBER ✦

Drift and diffusion of charge carriers in silicon and their empirical relation to the electronic field : M. A. Omar and L. Reggiani. Solid-St. Electron.30, 693 (1987)

Publisher: Elsevier Science
Year: 1988
Tongue: English
Weight: 122 KB
Volume: 28
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(88)90244-2

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Field dependence of the capture and re-e

Field dependence of the capture and re-emission of charge carriers by shallow levels in germanium and silicon : M. Martini and T. A. McNath. Solid St. Electron.16 (1973), p. 129

📂 Article 📅 1973 🏛 Elsevier Science 🌐 English ⚖ 108 KB