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Electron and hole drift velocity measurements in silicon and their empirical relation to electric field and temperature

โœ Scribed by Canali, C.; Majni, G.; Minder, R.; Ottaviani, G.


Book ID
114591950
Publisher
IEEE
Year
1975
Tongue
English
Weight
379 KB
Volume
22
Category
Article
ISSN
0018-9383

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