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Correction of secondary ion mass spectrometry profiles for atom diffusion measurements

✍ Scribed by A. Portavoce; N. Rodriguez; R. Daineche; C. Grosjean; C. Girardeaux

Book ID: 113792611
Publisher: Elsevier Science
Year: 2009
Tongue: English
Weight: 365 KB
Volume: 63
Category: Article
ISSN: 0167-577X
DOI: 10.1016/j.matlet.2008.12.018

No coin nor oath required. For personal study only.

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