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Controlling surface statistical properties using bias voltage: Atomic force microscopy and stochastic analysis

โœ Scribed by Sangpour, P.; Jafari, G. R.; Akhavan, O.; Moshfegh, A. Z.; Tabar, M. Reza Rahimi


Book ID
120590997
Publisher
The American Physical Society
Year
2005
Tongue
English
Weight
644 KB
Volume
71
Category
Article
ISSN
1098-0121

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