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Statistical Analysis of Long- and Short-Range Forces Involved in Bacterial Adhesion to Substratum Surfaces as Measured Using Atomic Force Microscopy
โ Scribed by Chen, Y.; Busscher, H. J.; van der Mei, H. C.; Norde, W.
- Book ID
- 121528594
- Publisher
- American Society for Microbiology
- Year
- 2011
- Tongue
- English
- Weight
- 539 KB
- Volume
- 77
- Category
- Article
- ISSN
- 0099-2240
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