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Controlling parameters of focused ion beam (FIB) on high aspect ratio micro holes milling

✍ Scribed by Jamaludin, Fatin Syazana; Mohd Sabri, Mohd Faizul; Said, Suhana Mohd


Book ID
121468148
Publisher
Springer-Verlag
Year
2013
Tongue
English
Weight
850 KB
Volume
19
Category
Article
ISSN
0946-7076

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The fabrication of high-aspect-ratio submicron-to-nanometer range microstructures in LiNbO using a state-of-the-art Schlum-3 ( ) berger AMS 3000 focused ion-beam FIB system is presented. The submicron structures with about 350 nm width and 1600 nm depth are fabricated by employing XeF gas-assisted g