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Ultra-high aspect ratio replaceable AFM tips using deformation-suppressed focused ion beam milling

✍ Scribed by Savenko, Alexey; Yildiz, Izzet; Petersen, Dirch Hjorth; Bøggild, Peter; Bartenwerfer, Malte; Krohs, Florian; Oliva, Maria; Harzendorf, Torsten


Book ID
121396471
Publisher
Institute of Physics
Year
2013
Tongue
English
Weight
913 KB
Volume
24
Category
Article
ISSN
0957-4484

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