𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Control of Cl2 plasma by electron-beam-excited plasma and poly-Si etching

✍ Scribed by Yasuhiro Mikawa; Ryu-ichi Miyano; Jun-ichi Inaguma; Yasunori Shiraki; Futoshi Mutsuga; Motoyuki Fujii; Shunjiro Ikezawa


Book ID
108390463
Publisher
Elsevier Science
Year
1998
Tongue
English
Weight
629 KB
Volume
51
Category
Article
ISSN
0042-207X

No coin nor oath required. For personal study only.


πŸ“œ SIMILAR VOLUMES


Sidewall protection by nitrogen and oxyg
✍ Hang-Sup Cho; Shinobu Takehiro; Masao Sakuraba; Junichi Murota πŸ“‚ Article πŸ“… 2005 πŸ› Elsevier Science 🌐 English βš– 300 KB

Sidewall protection by nitrogen and oxygen in poly-Si 1Γ€x Ge x anisotropic etching has been investigated using electron-cyclotron resonance (ECR) chlorine plasma. It was found that the sidewall protection with only N 2 addition is weaker than that of poly-Si. Highly anisotropic etching of poly-Si 0.